EIS Study - 430


Study Details

Parameter Value
ID 430
ACRONYM js2_decon_ref_vel_LT
TITLE js2_decon_ref_vel_LT
TARGET Active Region
NO. OF RASTERS 1

Raster #1

Parameter Value
RASTER ID 408
ACRONYM js2_1slit_scan_v3
LL_ID 222
RASTER TYPE SCANNING
NO. OF POINTING POSITIONS 160
SCAN STEP SIZE (arcsec) 1
NO. OF WINDOWS 4
WINDOW WIDTHS (pixels) 48,40,40,40
WINDOW HEIGHT (pixels) 512
SLIT/SLOT 1"
EXPOSURE TIMES (ms) 15000
EXPOSURE DELAY (ms) 0

Line List #1

Line Wavelength (Angstroms)
FeXXIV 192.04
FeXII 193.70
FeXII 195.12
FeXIV 211.39



Last Revised: Monday, 29-Jun-2007

Feedback and comments: webmaster

Email
 
Print
    
EIS partner logo