EIS Study - 429
Study Details
| Parameter |
Value |
| ID |
429 |
| ACRONYM |
js2_decon_slot_sc_LT |
| TITLE |
js2_decon_slot_scan_LT |
| TARGET |
Active Region |
| NO. OF RASTERS |
1 |
Raster #1
| Parameter |
Value |
| RASTER ID |
407 |
| ACRONYM |
js2_40slot_scan_v3 |
| LL_ID |
221 |
| RASTER TYPE |
SCANNING |
| NO. OF POINTING POSITIONS |
5 |
| SCAN STEP SIZE (arcsec) |
30 |
| NO. OF WINDOWS |
4 |
| WINDOW WIDTHS (pixels) |
48,56,56,48 |
| WINDOW HEIGHT (pixels) |
512 |
| SLIT/SLOT |
40" |
| EXPOSURE TIMES (ms) |
15000 |
| EXPOSURE DELAY (ms) |
0 |
Line List #1
| Line |
Wavelength (Angstroms) |
| FeXXIV |
192.04 |
| FeXII |
193.52 |
| FeXII |
195.12 |
| FeXIV |
211.34 |
Last Revised: Monday, 29-Jun-2007
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