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EIS Study - 389
Study Details
Parameter |
Value |
ID |
389 |
ACRONYM |
calib_slit_slot_v2 |
TITLE |
Calibration study for measuring slit tilts and widths |
TARGET |
Quiet Sun |
NO. OF RASTERS |
3 |
Raster #1
Parameter |
Value |
RASTER ID |
335 |
ACRONYM |
Slit_Slot_40_v1 |
LL_ID |
177 |
RASTER TYPE |
SCANNING |
NO. OF POINTING POSITIONS |
3 |
SCAN STEP SIZE (arcsec) |
32 |
NO. OF WINDOWS |
7 |
WINDOW WIDTHS (pixels) |
40,40,40,40,40,40,40 |
WINDOW HEIGHT (pixels) |
512 |
SLIT/SLOT |
40" |
EXPOSURE TIMES (ms) |
20000 |
EXPOSURE DELAY (ms) |
0 |
Line List #1
Line |
Wavelength (Angstroms) |
FeVIII |
185.21 |
FeXII |
195.12 |
FeXIII |
202.04 |
FeXIII |
203.83 |
HeII |
256.32 |
SiVII |
275.37 |
FeXV |
284.16 |
Raster #2
Parameter |
Value |
RASTER ID |
373 |
ACRONYM |
Slit_Slot_1_v2 |
LL_ID |
202 |
RASTER TYPE |
SCANNING |
NO. OF POINTING POSITIONS |
15 |
SCAN STEP SIZE (arcsec) |
1 |
NO. OF WINDOWS |
10 |
WINDOW WIDTHS (pixels) |
24,24,32,32,24,24,32,88,24,24 |
WINDOW HEIGHT (pixels) |
512 |
SLIT/SLOT |
1" |
EXPOSURE TIMES (ms) |
120000 |
EXPOSURE DELAY (ms) |
0 |
Line List #2
Line |
Wavelength (Angstroms) |
FeXI |
180.40 |
FeVIII |
185.21 |
FeXII |
193.54 |
FeXII |
195.12 |
FeIX |
197.86 |
FeXIII |
202.04 |
FeXIII |
203.83 |
FeX |
257.68 |
SX |
264.23 |
SiVII |
275.35 |
Raster #3
Parameter |
Value |
RASTER ID |
374 |
ACRONYM |
Slit_Slot_2_v2 |
LL_ID |
202 |
RASTER TYPE |
SCANNING |
NO. OF POINTING POSITIONS |
15 |
SCAN STEP SIZE (arcsec) |
2 |
NO. OF WINDOWS |
10 |
WINDOW WIDTHS (pixels) |
24,24,32,32,24,24,32,88,24,24 |
WINDOW HEIGHT (pixels) |
512 |
SLIT/SLOT |
2" |
EXPOSURE TIMES (ms) |
80000 |
EXPOSURE DELAY (ms) |
0 |
Line List #3
Line |
Wavelength (Angstroms) |
FeXI |
180.40 |
FeVIII |
185.21 |
FeXII |
193.54 |
FeXII |
195.12 |
FeIX |
197.86 |
FeXIII |
202.04 |
FeXIII |
203.83 |
FeX |
257.68 |
SX |
264.23 |
SiVII |
275.35 |
Last Revised: Monday, 29-Jun-2007
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