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EIS Study - 389
Study Details
| Parameter |
Value |
| ID |
389 |
| ACRONYM |
calib_slit_slot_v2 |
| TITLE |
Calibration study for measuring slit tilts and widths |
| TARGET |
Quiet Sun |
| NO. OF RASTERS |
3 |
Raster #1
| Parameter |
Value |
| RASTER ID |
335 |
| ACRONYM |
Slit_Slot_40_v1 |
| LL_ID |
177 |
| RASTER TYPE |
SCANNING |
| NO. OF POINTING POSITIONS |
3 |
| SCAN STEP SIZE (arcsec) |
32 |
| NO. OF WINDOWS |
7 |
| WINDOW WIDTHS (pixels) |
40,40,40,40,40,40,40 |
| WINDOW HEIGHT (pixels) |
512 |
| SLIT/SLOT |
40" |
| EXPOSURE TIMES (ms) |
20000 |
| EXPOSURE DELAY (ms) |
0 |
Line List #1
| Line |
Wavelength (Angstroms) |
| FeVIII |
185.21 |
| FeXII |
195.12 |
| FeXIII |
202.04 |
| FeXIII |
203.83 |
| HeII |
256.32 |
| SiVII |
275.37 |
| FeXV |
284.16 |
Raster #2
| Parameter |
Value |
| RASTER ID |
373 |
| ACRONYM |
Slit_Slot_1_v2 |
| LL_ID |
202 |
| RASTER TYPE |
SCANNING |
| NO. OF POINTING POSITIONS |
15 |
| SCAN STEP SIZE (arcsec) |
1 |
| NO. OF WINDOWS |
10 |
| WINDOW WIDTHS (pixels) |
24,24,32,32,24,24,32,88,24,24 |
| WINDOW HEIGHT (pixels) |
512 |
| SLIT/SLOT |
1" |
| EXPOSURE TIMES (ms) |
120000 |
| EXPOSURE DELAY (ms) |
0 |
Line List #2
| Line |
Wavelength (Angstroms) |
| FeXI |
180.40 |
| FeVIII |
185.21 |
| FeXII |
193.54 |
| FeXII |
195.12 |
| FeIX |
197.86 |
| FeXIII |
202.04 |
| FeXIII |
203.83 |
| FeX |
257.68 |
| SX |
264.23 |
| SiVII |
275.35 |
Raster #3
| Parameter |
Value |
| RASTER ID |
374 |
| ACRONYM |
Slit_Slot_2_v2 |
| LL_ID |
202 |
| RASTER TYPE |
SCANNING |
| NO. OF POINTING POSITIONS |
15 |
| SCAN STEP SIZE (arcsec) |
2 |
| NO. OF WINDOWS |
10 |
| WINDOW WIDTHS (pixels) |
24,24,32,32,24,24,32,88,24,24 |
| WINDOW HEIGHT (pixels) |
512 |
| SLIT/SLOT |
2" |
| EXPOSURE TIMES (ms) |
80000 |
| EXPOSURE DELAY (ms) |
0 |
Line List #3
| Line |
Wavelength (Angstroms) |
| FeXI |
180.40 |
| FeVIII |
185.21 |
| FeXII |
193.54 |
| FeXII |
195.12 |
| FeIX |
197.86 |
| FeXIII |
202.04 |
| FeXIII |
203.83 |
| FeX |
257.68 |
| SX |
264.23 |
| SiVII |
275.35 |
Last Revised: Monday, 29-Jun-2007
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