EIS Study - 376
Study Details
| Parameter |
Value |
| ID |
376 |
| ACRONYM |
SK_DEEP_10x512_SLIT2 |
| TITLE |
Deep exposure with 2 arcsec slit for measuring precise velocity |
| TARGET |
Quiet Sun |
| NO. OF RASTERS |
1 |
Raster #1
| Parameter |
Value |
| RASTER ID |
360 |
| ACRONYM |
SK_DEEP_10x512_SLIT2 |
| LL_ID |
193 |
| RASTER TYPE |
SCANNING |
| NO. OF POINTING POSITIONS |
5 |
| SCAN STEP SIZE (arcsec) |
2 |
| NO. OF WINDOWS |
16 |
| WINDOW WIDTHS (pixels) |
24,24,24,32,48,24,24,24,24,24,24,24,24,24,24,24 |
| WINDOW HEIGHT (pixels) |
512 |
| SLIT/SLOT |
2" |
| EXPOSURE TIMES (ms) |
60000 |
| EXPOSURE DELAY (ms) |
0 |
Line List #1
| Line |
Wavelength (Angstroms) |
| FeXI |
180.40 |
| FeX |
184.54 |
| FeVIII |
186.60 |
| FeXI |
188.23 |
| CaXVII |
192.63 |
| FeXII |
195.12 |
| FeXIII |
202.04 |
| OV |
248.46 |
| HeII |
256.32 |
| FeX |
257.26 |
| SiX |
261.04 |
| FeXIV |
264.78 |
| MgVI |
269.00 |
| SiVII |
275.35 |
| OIV |
279.93 |
| FeXV |
284.16 |
Last Revised: Monday, 29-Jun-2007
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