EIS Study - 295


Study Details

Parameter Value
ID 295
ACRONYM SK_QS_34x168c
TITLE SK_QS_34x168c_210sec
TARGET Quiet Sun
NO. OF RASTERS 1

Raster #1

Parameter Value
RASTER ID 278
ACRONYM SK_QS_34x168c
LL_ID 135
RASTER TYPE SCANNING
NO. OF POINTING POSITIONS 9
SCAN STEP SIZE (arcsec) 4
NO. OF WINDOWS 7
WINDOW WIDTHS (pixels) 40,32,24,32,24,32,24
WINDOW HEIGHT (pixels) 168
SLIT/SLOT 2"
EXPOSURE TIMES (ms) 20000
EXPOSURE DELAY (ms) 0

Line List #1

Line Wavelength (Angstroms)
FeXII 186.70
CaXVII 192.82
FeXII 195.12
HeII 256.32
SiX 261.04
FeXXIII 263.76
FeXV 284.16



Last Revised: Monday, 29-Jun-2007

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