EIS Study - 280
Study Details
Parameter |
Value |
ID |
280 |
ACRONYM |
cmeo_slot_lo |
TITLE |
CME Onset - slot study - lo telemetry rate |
TARGET |
Active Region |
NO. OF RASTERS |
1 |
Raster #1
Parameter |
Value |
RASTER ID |
265 |
ACRONYM |
cmeo_slot_lo |
LL_ID |
128 |
RASTER TYPE |
SCANNING |
NO. OF POINTING POSITIONS |
6 |
SCAN STEP SIZE (arcsec) |
40 |
NO. OF WINDOWS |
5 |
WINDOW WIDTHS (pixels) |
40,40,40,40,40 |
WINDOW HEIGHT (pixels) |
320 |
SLIT/SLOT |
40" |
EXPOSURE TIMES (ms) |
30000 |
EXPOSURE DELAY (ms) |
0 |
Line List #1
Line |
Wavelength (Angstroms) |
FeXII |
186.75 |
OV |
192.90 |
FeXII |
195.12 |
HeII |
256.32 |
FeXVI |
262.98 |
Last Revised: Monday, 29-Jun-2007
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