EIS Study - 255
Study Details
Parameter |
Value |
ID |
255 |
ACRONYM |
cme_slit_red_lkh |
TITLE |
filament study: slit raster |
TARGET |
Quiet Sun |
NO. OF RASTERS |
1 |
Raster #1
Parameter |
Value |
RASTER ID |
243 |
ACRONYM |
CME_slit_red |
LL_ID |
118 |
RASTER TYPE |
SCANNING |
NO. OF POINTING POSITIONS |
61 |
SCAN STEP SIZE (arcsec) |
4 |
NO. OF WINDOWS |
9 |
WINDOW WIDTHS (pixels) |
24,32,32,24,24,32,32,32,32 |
WINDOW HEIGHT (pixels) |
504 |
SLIT/SLOT |
2" |
EXPOSURE TIMES (ms) |
30000 |
EXPOSURE DELAY (ms) |
0 |
Line List #1
Line |
Wavelength (Angstroms) |
FeX |
184.54 |
FeXXIV |
192.04 |
CaXVII |
192.82 |
FeXII |
195.12 |
FeXIII |
202.04 |
HeII |
256.32 |
SiX |
258.37 |
SiX |
261.04 |
SiVII |
275.35 |
Last Revised: Monday, 29-Jun-2007
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